Electronic and structural properties of the InP(100)(2×4) surface studied by core-level photoemission and scanning tunneling microscopy
| Autor: | V. Rimpilainen, Pekka Laukkanen, J. Pakarinen, Janusz Sadowski, M. Ahola-Tuomi, M. Pessa, Martin Adell, I. J. Vayrynen, R.E. Perälä, Mikhail Kuzmin, Antti Tukiainen |
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| Rok vydání: | 2006 |
| Předmět: |
Surface (mathematics)
Chemistry Analytical chemistry Synchrotron radiation Surfaces and Interfaces Condensed Matter Physics Kinetic energy Spectral line Surfaces Coatings and Films law.invention X-ray photoelectron spectroscopy law Materials Chemistry Core level Scanning tunneling microscope Surface reconstruction |
| Zdroj: | Surface Science. 600:3022-3027 |
| ISSN: | 0039-6028 |
| DOI: | 10.1016/j.susc.2006.05.021 |
| Popis: | The (2 × 4)-reconstructed InP(1 0 0) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the α2 model describes the atomic structure of the InP(1 0 0)(2 × 4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(1 0 0)(2 × 4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(1 0 0)(2 × 4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4 eV higher and 0.3 eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively. |
| Databáze: | OpenAIRE |
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