Electronic and structural investigations of technetium compounds by x-ray absorption spectroscopy

Autor:	Tobias Reich, H. Nitsche, Ilham Almahamid, E. A. Hudson, Nikolas Kaltsoyannis, Norman M. Edelstein, J. C. Bryan, Anthony K. Burrell, Wayne W. Lukens, David K. Shuh, Jerome J. Bucher
Rok vydání:	1995
Předmět:	Inorganic Chemistry X-ray spectroscopy X-ray absorption spectroscopy Crystallography Valence (chemistry) Absorption spectroscopy K-edge Extended X-ray absorption fine structure Chemistry Chemical shift Analytical chemistry Physical and Theoretical Chemistry Spectroscopy
Zdroj:	Inorganic Chemistry. 34:193-198
ISSN:	1520-510X 0020-1669
DOI:	10.1021/ic00105a032
Popis:	X-ray absorption near edge structure spectroscopy has been used to establish the chemical shifts of the technetium K edge in a range of compounds containing Tc in a variety of formal oxidation states. The edge positions span 19.9 eV from Tc metal to NH{sub 4}TcO{sub 4}. Strong correlation between chemical shift and formal oxidation state is observed. Extended X-ray absorption fine structure (EXAFS) spectroscopy of Tc{sub 2}(CO){sub 10} indicates that multiple scattering along the Tc-C-O vector is more important than direct Tc{center_dot}{center_dot}O scattering. TcO{sub 2} is shown by EXAFS to possess a distorted rutile structure with a closest Tc-Tc distance of 2.61 {Angstrom}. This is rationalized in terms of the Goodenough model for bonding in transition metal dioxides.
Databáze:	OpenAIRE
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