| Autor: |
M. Delaney, L. Nguyen, B.M. Paine, R. Wong, K. Hum, A. Schmitz, R. Walden |
| Rok vydání: |
2002 |
| Předmět: |
|
| Zdroj: |
2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513). |
| DOI: |
10.1109/gaasrw.2000.902417 |
| Popis: |
We report on reliability tests on InP HEMT MMICs by two approaches. First we describe elevated-temperature lifetests on Ka-band LNA MMICs, for studying all thermally-driven degradation mechanisms. Then we describe ramped-voltage studies of separate capacitors, for measuring time-dependent dielectric breakdown (TDDB), which is accelerated mostly by elevated voltage. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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