Graph based fault model definition for bus testing
Autor: | Mohamad Hashem Haghbayan, Elmira Karimi, Mahmoud Tabandeh, Adele Maleki |
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Rok vydání: | 2013 |
Předmět: | |
Zdroj: | VLSI-SoC |
Popis: | In this paper we present a new fault model for testing standard On-Chip buses using a graph model. This method will be optimized for speed of testing. Using AMBA-AHB as the experimental result, the proposed fault model shows efficiency in comparison with corresponding stuck-at fault testing. |
Databáze: | OpenAIRE |
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