Characterization of anodic oxide film formed on tin coating in neutral borate buffer solution
| Autor: | Shigeyo Watanabe, Patrick James, Masahiro Seo, Kazuhisa Azumi, William H. Smyrl, Yukio Inokuchi, Isao Saeki |
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| Rok vydání: | 1998 |
| Předmět: |
Photocurrent
General Chemical Engineering Inorganic chemistry Oxide chemistry.chemical_element General Chemistry Buffer solution engineering.material equipment and supplies Corrosion chemistry.chemical_compound chemistry Coating engineering General Materials Science Cyclic voltammetry Tin Layer (electronics) |
| Zdroj: | Corrosion Science. 40:1363-1377 |
| ISSN: | 0010-938X |
| DOI: | 10.1016/s0010-938x(98)00031-6 |
| Popis: | Properties of the oxide layer formed on a TiN coating by anodic oxidation in neutral borate buffer solution were investigated using cyclic voltammetry, AFM, FT-IR, impedance and photocurrent measurements. The voltammogram showed imperfections in the TiN coating and high susceptibility of anodic oxidation. The result of FT-IR showed the composition of an oxide layer, similar to TiO2, including OH− or water. Both impedance and photocurrent results confirmed that the oxide film has n-type semiconductor properties. The oxide would contain defects acting as intergap states, resulting in low efficiency of photo-induced free-carrier generation. It seems that these defects have their origin in degradation of the protective property of a TiN coating under anodic polarization. |
| Databáze: | OpenAIRE |
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