Analysis of Intrinsic Variation of Data Retention in Phase-Change Memory Using Phase-Field Method

Autor:	Keun-Ho Lee, Young-Kwan Park, Yongwoo Kwon, Dae-Hwan Kang, Chilhee Chung
Rok vydání:	2013
Předmět:	Phase-change memory Crystallography Materials science Field (physics) Phase (matter) Monte Carlo method Nucleation Crystallite Statistical physics Electrical and Electronic Engineering Data retention Scaling Electronic Optical and Magnetic Materials
Zdroj:	IEEE Electron Device Letters. 34:411-413
ISSN:	1558-0563 0741-3106
DOI:	10.1109/led.2013.2242038
Popis:	We investigated the intrinsic variation of retention in phase-change memory using a phase-field method that is capable of depicting stochastic nucleation followed by the growth of the nucleated crystallites. We found that the median of the retention time increases upon scaling unlike the Monte Carlo results previously reported. More importantly, the industrial requirement, which is ten years at 70 °C, can be guaranteed for 1-ppb tail bits down to the 10-nm technology, although statistical spread increases.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::182ae2307ac2e71edbf73694718cd3d1 https://doi.org/10.1109/led.2013.2242038 Zobrazit plný text záznamu