Structural behaviour of Mg, Al and Si doped niobium oxynitrides under high pressures

Autor:	Y. Ohashi, Bharat Bhooshan Sharma, Shinichi Kikkawa, J. V. Yakhmi, Himanshu K. Poswal, Surinder M. Sharma
Rok vydání:	2013
Předmět:	Diffraction Materials science Silicon Doping Niobium Analytical chemistry chemistry.chemical_element Mineralogy Crystal structure Synchrotron law.invention chemistry Aluminium law X-ray crystallography
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
DOI:	10.1063/1.4790934
Popis:	We have investigated the high pressure behaviour of Mg, Al and Si doped niobium oxynitrides employing synchrotron based angle dispersive x-ray diffraction experiments. All the oxynitrides are found to be stable up to the highest pressure studied. Equation of state and bulk modulii have been determined and the latter are found to be linearly related to the ambient volumes for these compounds.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1814f2af0d8966ca322e5de487846a4f https://doi.org/10.1063/1.4790934 Zobrazit plný text záznamu