Measurement of Edge Localized Mode using Fast Camera in NSTX

Autor:	Ricardo Maqueda, Rajesh Maingi, Nstx Team, Stewart Zweben, Dan Stutman, Lane Roquemore, Nobuhiro Nishino, T. M. Biewer, Kevin Tritz, C.E. Bush
Rok vydání:	2005
Předmět:	Physics Optics business.industry Divertor Electrical and Electronic Engineering business Edge-localized mode Simulation
Zdroj:	IEEJ Transactions on Fundamentals and Materials. 125:902-907
ISSN:	1347-5533 0385-4205
Popis:	This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1810b05fd71d0ccff9f2679a3d9f9973 https://doi.org/10.1541/ieejfms.125.902 Zobrazit plný text záznamu