Reliability concerns from the gray market
Autor: | Giovanna Mura |
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Rok vydání: | 2018 |
Předmět: |
010302 applied physics
End user Computer science media_common.quotation_subject 020208 electrical & electronic engineering Grey market 02 engineering and technology Condensed Matter Physics 01 natural sciences Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Counterfeit Risk analysis (engineering) Open market operation 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Quality (business) Electronics Electrical and Electronic Engineering Safety Risk Reliability and Quality Reliability (statistics) Screening procedures media_common |
Zdroj: | Microelectronics Reliability. :26-30 |
ISSN: | 0026-2714 |
Popis: | With the term “counterfeit electronic components”, we refer to electronic devices that are misrepresented as to their origin or quality. The greatest risks of using counterfeit parts are personal injury, mission failure and dramatic reduction of the reliability of a system and apparatus. Reliability issues concerning counterfeit electronics will be considered because the severity of this problem is likely to increase in the near future. We will highlight several examples as entire lots of unreliable microelectronic devices have reached the end user and only incoming lot inspection and screening procedures could have avoided a large number of field failures. The conclusion is a warning against the lack of reliability culture for end users of microelectronic devices under-evaluating the higher risks due to the low quality and poor reliability of the consumer electronics purchased in the open market sources rather than from authorized markets. |
Databáze: | OpenAIRE |
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