Prototype grooved and spherically bent Si backscattering crystal analyzer for meV resolution inelastic x‐ray scattering
| Autor: | R. C. Blasdell, A. T. Macrander |
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| Rok vydání: | 1995 |
| Předmět: | |
| Zdroj: | Review of Scientific Instruments. 66:2075-2077 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1145732 |
| Popis: | The high‐order backscattering reflections from single crystals of silicon have mrad rocking curve widths that can be exploited to produce meV energy‐resolution focusing analyzer crystals for use in inelastic x‐ray scattering experiments at third‐generation synchrotron sources. The first generation of these analyzers has been limited in efficiency principally by slope and/or figure errors. We calculate the effect of slope errors on the theoretical energy resolution and focus spot size of a typical analyzer design using a ray‐tracing code to ensure that there are no unforeseen contributions to the energy resolution and efficiency. We also present measurements of the slope errors of the atomic planes for a prototype, spherically bent, strain‐relief grooved analyzer as proof that it is in principle possible to obtain the slope and figure error limits required for a high efficiency meV resolution backscattering crystal. |
| Databáze: | OpenAIRE |
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