Assembly Defect Classification of SMD Components by Cascade Convolutional Neural Network

Autor:	Young-Gyu Kim, Tae-Hyoung Park, Jong-Hyun Ryu
Rok vydání:	2019
Předmět:	Cascade Computer science business.industry Pattern recognition Artificial intelligence Electrical and Electronic Engineering business Convolutional neural network
Zdroj:	The transactions of The Korean Institute of Electrical Engineers. 68:1236-1243
ISSN:	2287-4364 1975-8359
DOI:	10.5370/kiee.2019.68.10.1236
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::178dba36f3085553d4d2fde2651b2456 https://doi.org/10.5370/kiee.2019.68.10.1236 Zobrazit plný text záznamu