Challenges in Statistical Analysis: Yesterday, Today, and Tomorrow: (Invited Paper)

Autor:	Michael Pronath
Rok vydání:	2019
Předmět:	Parametric analysis Computer science Statistical analysis Variation (game tree) Yesterday Reliability (statistics) Reliability engineering Parametric statistics Electronic circuit
Zdroj:	NEWCAS
DOI:	10.1109/newcas44328.2019.8961260
Popis:	Verification of custom circuit designs for parametric variation defects has become a must-have procedure for today's nanometer designs. Statistical analysis of circuits poses a challenge because the simulation effort is often high, and the accuracy of some statistical analysis methods is difficult to assess. This paper gives an overview of various approaches to address statistical parametric analysis with respect to their efficiency and reliability.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1710d98b59eb01579f78b068ec3b720e https://doi.org/10.1109/newcas44328.2019.8961260 Zobrazit plný text záznamu