From small angle x-ray scattering to reflectivity: Instrumentation and sample study
| Autor: | Gregory Beaucage, D. W. Hua, M. S. Kent |
|---|---|
| Rok vydání: | 1996 |
| Předmět: |
Materials science
Small-angle X-ray scattering Scattering business.industry Mechanical Engineering Instrumentation Resolution (electron density) Center (category theory) Condensed Matter Physics Optics Orders of magnitude (time) Mechanics of Materials Measuring instrument General Materials Science Small-angle scattering business |
| Zdroj: | Journal of Materials Research. 11:273-276 |
| ISSN: | 2044-5326 0884-2914 |
| DOI: | 10.1557/jmr.1996.0031 |
| Popis: | In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 A{sup {minus}1} in {ital q}. This allows the resolution of surface features of 10 to 1000 A. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera. {copyright} {ital 1996 Materials Research Society.} |
| Databáze: | OpenAIRE |
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