Sputter-pits casting to measure AMS sample consumption

Autor:	Stewart P.H.T. Freeman, Richard Shanks
Rok vydání:	2015
Předmět:	Nuclear and High Energy Physics Materials science Nuclear engineering Analytical chemistry Sample (graphics) Cathode Ion source law.invention law Sample size determination Casting (metalworking) Sputtering Instrumentation Beam (structure) Accelerator mass spectrometry
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 361:168-172
ISSN:	0168-583X
Popis:	Sample-use efficiency is an important accelerator mass spectrometry (AMS) parameter. Improvements promote increased counting statistics and the potential to reduce sample size or carrier added. Casting of the pit in Cs-sputtered targets has been done to measure primary-beam focus and to asses the effects of varying this through ion source geometry modifications on sample longevity, secondary-beam current and overall efficiency. Also demonstrated is the modification of the cathode to include a sacrificial layer of material around the sample. This allowed for improved sample consumption without loss of beam current. The techniques demonstrated here can aid in the optimisation of an ion source for maximum performance AMS.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::16eca8d1c4cf2c27aa9af1772e777359 https://doi.org/10.1016/j.nimb.2015.03.060 Zobrazit plný text záznamu Full Text from ScienceDirect