Combined experimental and theoretical study of EEL spectroscopy of dislocations in wide band gap semiconductors

Autor: A Gutiérrez-Sosa, U Bangert, C J Fall, R Jones, A T Blumenaul, P R Briddon, T Frauenheim
Rok vydání: 2018
Zdroj: Microscopy of Semiconducting Materials 2003 ISBN: 9781351074636
DOI: 10.1201/9781351074636-7
Databáze: OpenAIRE