| Autor: |
Peter Loosen, Juergen Jandeleit, Nicolas Wiedmann, Reinhart Poprawe |
| Rok vydání: |
1999 |
| Předmět: |
|
| Zdroj: |
Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.345432 |
| Popis: |
The degradation of GaAlAs/GaAs laser diode bars mounted on copper micro channel heat sinks was investigated using optical microscopy, scanning electron microscopy and EDX- spectroscopy. The high power diode lasers were characterized before and after burn-in and after long term lifetests. Changes in surface morphology and surface composition of the facets were detected as well as changes in threshold current, slope efficiency and wavelength. Due to the degradation threshold current increases and slope efficiency decreases while the wavelengths were shifted to higher values showing a broader spectral width. The influence of these changes on performance and lifetime of the high power diode lasers will be discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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