X-ray absorption fine structure spectroscopic study of (NH4)2ReF6
| Autor: | David W. Hatchett, James Louis-Jean, Samundeeswari Mariappan Balasekaran, Cassara Higgins, Harry Jang, Frederic Poineau, Alfred P. Sattelberger |
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| Rok vydání: | 2019 |
| Předmět: |
Materials science
Extended X-ray absorption fine structure General Chemical Engineering General Engineering Analytical chemistry General Physics and Astronomy XANES X-ray absorption fine structure Absorption edge Crystal field theory General Earth and Planetary Sciences General Materials Science Absorption (electromagnetic radiation) Spectroscopy Single crystal General Environmental Science |
| Zdroj: | SN Applied Sciences. 1 |
| ISSN: | 2523-3971 2523-3963 |
| Popis: | The (NH4)2ReX6 (X = F, Cl, Br, I) salts have been investigated by x-ray absorption fine structure spectroscopy. The Re-F distance determined by EXAFS in (NH4)2ReF6 (i.e., 1.95 A) is in good agreement with the one determined by single crystal x-ray diffraction in A2ReF6 salts (A = K, Rb, Cs). The XANES studies of (NH4)2ReX6 (X = F, Cl, Br, I) indicates that the positions of the absorption edge and of the white line are shifted to higher energy when moving from I to F. These shifts have been explained in terms of the crystal field splitting parameter and covalent charge carried by the Re atoms. Calculations of the XANES spectra of the ReX62− (X = F, Cl, Br, I) anions at the Re-L3 edge have been performed and the calculated shifts and intensity of the white lines reproduce well the experimental observations. |
| Databáze: | OpenAIRE |
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