Study of ultra-thin films in multilayer structures by standing -waves and small- angle x-ray scattering techniques
| Autor: | A.A. Fraerman, Yu. Ya. Platonov, N.I. Polushkin, N.N. Salashchenko, S.I. Zheludeva, M.V. Kovalchuk, N.N. Novikova, I.V. Bashelhanov, A.V. Shubnikov |
|---|---|
| Rok vydání: | 1992 |
| Zdroj: | Physics of X-Ray Multilayer Structures. |
| DOI: | 10.1364/pxrayms.1992.mc8 |
| Popis: | The traditional method for LSM parameters investigation uses small angle x-ray diffraction at λ=0.1nm. The parameters of interest have been determined by comparing the theoretical angular dependencies of reflectivity as a functions of these parameters with the experimental curves. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|