The Development of Structure in Electrodeposited Co
| Autor: | T. S. Eagleton, J. P. G. Farr |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
010302 applied physics
Materials science 020209 energy Metals and Alloys Crystal orientation Mineralogy 02 engineering and technology Surfaces and Interfaces Crystal structure Condensed Matter Physics 01 natural sciences Surfaces Coatings and Films Crystallography Mechanics of Materials 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Development (differential geometry) Crystallite |
| Zdroj: | Transactions of the IMF. 80:9-12 |
| ISSN: | 1745-9192 0020-2967 |
| DOI: | 10.1080/00202967.2002.11871419 |
| Popis: | Co layers 25, 50 and 100 nm thick have been electrodeposited onto polycrystalline Cu. The development of the crystal structure of the layers has been examined using crystal orientation mapping (COM) and related to that of the underlying Cu. The magnetic properties of the electrodeposited Co film 100 nm thick have been examined using the MOKE and the magnetic properties have been related to the crystallographic structure. |
| Databáze: | OpenAIRE |
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