The role of the tunneling component in the current–voltage characteristics of metal-GaN Schottky diodes

Autor: S. S. Lau, L. S. Yu, Joan M. Redwing, Q. J. Xing, Q. Z. Liu, D. Qiao
Rok vydání: 1998
Předmět:
Zdroj: Journal of Applied Physics. 84:2099-2104
ISSN: 1089-7550
0021-8979
DOI: 10.1063/1.368270
Popis: The temperature dependence of the current–voltage characteristics of Ni–GaN Schottky barriers have been measured and analyzed. It was found that the enhanced tunneling component in the transport current of metal-GaN Schottky barrier contacts is a likely explanation for the large scatter in the measured Richardson constant.
Databáze: OpenAIRE