The role of the tunneling component in the current–voltage characteristics of metal-GaN Schottky diodes
Autor: | S. S. Lau, L. S. Yu, Joan M. Redwing, Q. J. Xing, Q. Z. Liu, D. Qiao |
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Rok vydání: | 1998 |
Předmět: | |
Zdroj: | Journal of Applied Physics. 84:2099-2104 |
ISSN: | 1089-7550 0021-8979 |
DOI: | 10.1063/1.368270 |
Popis: | The temperature dependence of the current–voltage characteristics of Ni–GaN Schottky barriers have been measured and analyzed. It was found that the enhanced tunneling component in the transport current of metal-GaN Schottky barrier contacts is a likely explanation for the large scatter in the measured Richardson constant. |
Databáze: | OpenAIRE |
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