Characterization of p-n junctions under the influence of a time varying mechanical strain

Autor: L. K. Monteith, J.J. Wortman
Rok vydání: 1973
Předmět:
Zdroj: Solid-State Electronics. 16:229-237
ISSN: 0038-1101
Popis: This paper is concerned with the influence of time varying mechanical stress on the electrical properties of p-n junctions. A strain generator based upon a vibrating cantilever beam is described. Data obtained on silicon junctions are presented and compared to a theoretical model for the effects. The results indicate that the major effect of mechanical strain is to change the energy band structure of the semiconductor.
Databáze: OpenAIRE