Dynamic power supply current monitoring of SRAMs

Autor:	R.Z. Makki, Shyang-Tai Su, H.T. Nagle, Jian Liu
Rok vydání:	2002
Předmět:	Engineering CMOS Logic state business.industry Dynamic demand Logic testing Electronic engineering Supply current Hardware_PERFORMANCEANDRELIABILITY Transient (oscillation) Test method business Power (physics)
Zdroj:	Proceedings Seventh Annual IEEE International ASIC Conference and Exhibit.
DOI:	10.1109/asic.1994.404538
Popis:	In this paper, we report the results of a physical experiment aimed at assessing a new test method for CMOS SRAMs. The test method involves a new and simple philosophy for testing: monitor the switching behavior of a circuit rather than just the output logic state. Observing the dynamic (transient) power supply current can lead to drastic improvement in "real" defect coverage. We use the dynamic power supply current as indicative of such switching. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::15e98b801b2fcfe21807f745949720f6 https://doi.org/10.1109/asic.1994.404538 Zobrazit plný text záznamu