| Autor: |
A.E.C. Spargo, P.G. Self, Rob W. Glaisher |
| Rok vydání: |
1990 |
| Předmět: |
|
| Zdroj: |
Ultramicroscopy. 32:299-308 |
| ISSN: |
0304-3991 |
| Popis: |
The tuned-voltage effect occurs when zone-axis diffraction emulates symmetrical-two-beam conditions. The nature of the tuned-voltage effect is examined in detail from both the Bloch wave and physical optics (multislice) methods. These methods delineate the true nature of the effect. Exploitation of the tuned-voltage effect in high-resolution transmission electron microscopy is discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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