Physical characterization of thin-film solar cells
| Autor: | Sally Asher, Dean H. Levi, Mathias Terheggen, Wolfram Jaegermann, P.D. Paulson, Brian E. McCandless, Ken Durose, James R. Sites, Glenn Teeter, Helio Moutinho, Craig L. Perkins, Wyatt K. Metzger |
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| Rok vydání: | 2004 |
| Předmět: |
Auger electron spectroscopy
Photoluminescence Renewable Energy Sustainability and the Environment Chemistry Analytical chemistry Condensed Matter Physics Cadmium telluride photovoltaics Electronic Optical and Magnetic Materials law.invention Characterization (materials science) Secondary ion mass spectrometry Scanning probe microscopy X-ray photoelectron spectroscopy law Solar cell Electrical and Electronic Engineering |
| Zdroj: | Progress in Photovoltaics: Research and Applications. 12:177-217 |
| ISSN: | 1099-159X 1062-7995 |
| Popis: | The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems. |
| Databáze: | OpenAIRE |
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