| Autor: |
G. C. Stuart, K. Elliott, S. McCoy, David Malcolm Camm, J.J. Cibere |
| Rok vydání: |
2004 |
| Předmět: |
|
| Zdroj: |
11th IEEE International Conference on Advanced Thermal Processing of Semiconductors. RTP 2003. |
| DOI: |
10.1109/rtp.2003.1249124 |
| Popis: |
The recent capability to achieve sub-millisecond surface temperature increases of greater than 600/spl deg/C over the entire surface of 300 mm wafers using flash-assist rapid thermal processing, fRTP/sup TM/ has allowed the exploration of silicon's response to rapid thermal processes over the entire surface of the wafer. Previous results from high-speed processing of silicon through its equilibrium melting point have only been attainable by localized, small area, application of high-powered lasers. We report data obtained from a narrow band radiometer, operating at 1450/spl plusmn/30 nm with a 25 kHz sampling rate, that indicates anomalous emissions during melting. Interesting re-crystallization behavior of the bare silicon surface that is cooling 500.000/spl deg/C/s through its equilibrium melting point after a flash anneal from an intermediate temperature of 900/spl deg/C is also reported. Wafer survivability after exposure to greater than 600/spl deg/C surface temperature jumps from intermediate temperatures of 700/spl deg/C to 900/spl deg/C also demonstrates the inherent robustness of the wafer to withstand large thermal gradient at elevated bulk temperatures imposed during fRTP. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
