Toward a surface photoelectron diffractometer: A progress report on selected advances and an assessment
| Autor: | Louis J. Terminello, Barry L. Petersen, John J. Barton, D.A. Shirley, Yu Zheng, W.R.A. Huff, Zahid Hussain |
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| Rok vydání: | 1994 |
| Předmět: |
Surface (mathematics)
Radiation Chemistry Holography Analytical chemistry Nanotechnology Condensed Matter Physics Atomic and Molecular Physics and Optics Electron holography Electronic Optical and Magnetic Materials law.invention Electron diffraction law Physical and Theoretical Chemistry Spectroscopy Diffractometer |
| Zdroj: | Journal of Electron Spectroscopy and Related Phenomena. 68:49-61 |
| ISSN: | 0368-2048 |
| DOI: | 10.1016/0368-2048(94)02102-3 |
| Popis: | X-ray diffractometric determination of atomic structures in ordered bulk systems is highly automated and has wide application. By contrast, surface crystallography, whether based on photon or electron scattering, is still in a relatively early stage of development. A summary is given of recent selected highlights in efforts to make progress toward surface photoelectron diffractometry and holography by our Berkeley-Penn State group. It is concluded that an automated photoelectron diffractometer is practical and desirable. |
| Databáze: | OpenAIRE |
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