| Popis: |
Microlenses and microlens arrays present challenging measurement problems to manufacturer and user alike. Standard techniques designed for testing larger optical components are impractical for lenses with dimensions of only a few hundred micrometers. We present several methods for characterizing the wavefront, focal length, surface profile, and other parameters of microlenses and microlens arrays. The use of Mach-Zehnder and Twyman-Green interferometers for wavefront and focal length measurement are discussed in some detail. |
