Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC

Autor:	Artem N. Tsirkov
Rok vydání:	2022
Zdroj:	2022 Moscow Workshop on Electronic and Networking Technologies (MWENT).
DOI:	10.1109/mwent55238.2022.9802407
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::15837fa00d988a2d8b5881b9c78ab3f3 https://doi.org/10.1109/mwent55238.2022.9802407 Zobrazit plný text záznamu