Functional testing of digital signal processors in radiation experiments
| Autor: | P. V. Nekrasov, V. A. Marfin, A. Yu. Nikiforov, O. A. Kalashnikov |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Digital signal processor business.industry Computer science Functional testing Radiation Condensed Matter Physics 01 natural sciences Electronic Optical and Magnetic Materials Software 0103 physical sciences Materials Chemistry ComputerSystemsOrganization_SPECIAL-PURPOSEANDAPPLICATION-BASEDSYSTEMS Electrical and Electronic Engineering 010306 general physics business Computer hardware |
| Zdroj: | Russian Microelectronics. 46:171-179 |
| ISSN: | 1608-3415 1063-7397 |
| DOI: | 10.1134/s1063739717030052 |
| Popis: | This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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