Scanning Kelvin probe as a high resolution surface analysis device
| Autor: | H.-D. Liess, H. Baumgärtner, R. Mäckel, J. Ren |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Surface (mathematics)
Kelvin probe force microscope Materials science business.industry Resolution (electron density) Metals and Alloys Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Optics Materials Chemistry Electrical and Electronic Engineering business Instrumentation |
| Zdroj: | Sensors and Actuators B: Chemical. 14:739-740 |
| ISSN: | 0925-4005 |
| DOI: | 10.1016/0925-4005(93)85165-7 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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