Demonstration of a SiGe RF LNA design using IBM design kits in 0.18 μm SiGe BiCMOS technology

Autor:	null Yiming Chen, null Xiaojuen Yuan, D. Scagnelli, J. Mecke, J. Gross, D. Harame
Rok vydání:	2004
Zdroj:	Proceedings. Design, Automation and Test in Europe Conference and Exhibition.
DOI:	10.1109/date.2004.1269193
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::14c1e6f96b37414fe05eaf7f422b3352 https://doi.org/10.1109/date.2004.1269193 Zobrazit plný text záznamu