Feature Selective Validation Analysis applied to The Measurement of Electronic Circuit Electromagnetic Conducted Emissions - CISPR 25
| Autor: | Marcelo Bender Perotoni, T. Silveira, Mateus Andrade, Ednaldo Ferreira, Decio Renno, Kenedy Marconi, M.S. Novo, Samuel Marchiori |
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| Rok vydání: | 2019 |
| Předmět: |
Computer science
020208 electrical & electronic engineering Schematic 020206 networking & telecommunications 02 engineering and technology Printed circuit board Amplitude Feature (computer vision) EMI 0202 electrical engineering electronic engineering information engineering Waveform Pulse-width modulation Simulation Electronic circuit |
| Zdroj: | 2019 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC). |
| Popis: | This paper proposes to investigate, with physical measurements, the layout influence of two PCB boards from the viewpoint of conducted emission. Two solid state H-bridges, with identical schematics but different layouts were tested. In this paper, a correlation plan of the actual measurements focusing on the conducted emissions (CISPR-25) is proposed. In order to evaluate the measurements in a more objective way, the comparisons were quantitatively evaluated using the Feature Selective Validation (FSV) algorithm, which has a good acceptance for the comparison between simulation and measurement results in the EMC/EMI area. This method allows the analysis of amplitude and frequency characteristics of an arbitrary waveform showing the correlation and, in this experiment, determine if it is possible to minimize the effect of the conducted emission by layout modification or if the differences are so small that a modification is not justified. So, the use o FSV correlation methodology in this work helps determine if the measurements in both layouts have a reasonable correlation. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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