Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe
| Autor: | Manabu Ishino, Jongsuck Bae, Tatsuo Nozokido |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Electromagnetic field Materials science Admittance business.industry Astrophysics::Instrumentation and Methods for Astrophysics Physics::Optics Near and far field 02 engineering and technology Scanning capacitance microscopy 021001 nanoscience & nanotechnology 01 natural sciences law.invention Optics Scanning voltage microscopy law 0103 physical sciences Reflection coefficient 0210 nano-technology business Waveguide Vibrational analysis with scanning probe microscopy |
| Zdroj: | 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz). |
| DOI: | 10.1109/irmmw-thz.2016.7758622 |
| Popis: | We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments. |
| Databáze: | OpenAIRE |
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