Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena

Autor:	Kazunari Sasaki, Tomoo Yoshizumi, Takami Hosoi, Yusuke Shiratori, Kengo Haga, Shunsuke Taniguchi, Hiroaki Yoshitomi
Rok vydání:	2013
Předmět:	Materials science Chemical engineering Dopant Impurity Diffusion Phase (matter) Degradation (geology) Electrolyte Dissolution Chemical decomposition
Zdroj:	ECS Transactions. 57:315-323
ISSN:	1938-6737 1938-5862
DOI:	10.1149/05701.0315ecst
Popis:	Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been systematically analyzed and classified based on both thermochemical and kinetic consideration. We present typical intrinsic chemical degradation phenomena observed, mainly diffusion-related processes (interdiffusion, grainboundary diffusion, dopant dissolution, phase transformation etc.) around interfaces between the electrolyte and the electrode, which has been revealed through high-resolution STEM-EDX analysis of cells after long-term operation. Degradation mechanisms have been classified.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::148a93ee80f0ee1c4d58699212f87969 https://doi.org/10.1149/05701.0315ecst Zobrazit plný text záznamu