Plasma Enhanced Chemical Vapor Deposition Synthesizing Carbon Nitride Hard Thin Films

Autor: X.J. Fan, Zhihong Zhang, Wei Zhang, Ming-sheng Ye, Xian-quan Meng, H.X. Guo
Rok vydání: 1998
Předmět:
Zdroj: Chinese Physics Letters. 15:913-915
ISSN: 1741-3540
0256-307X
Popis: Using plasma enhanced chemical vapor deposition and SiC and carbon buffer layers, we have obtained carbon nitride thin films on Si(100) and Si(111). The x-ray diffraction and x-ray photoelectron spectroscopy are used to characterize the thin films. The Vickers hardness of the carbon nitride thin films is more than 5100 kgf/mm2 and comparable to that of diamond.
Databáze: OpenAIRE