Experimental Study for Gate Trap and Generation Current using DCIV Method

Autor:	Dong Bin Lee, Taesik Park, Myoung Jin Lee, Won Hyeok Choi, Young Kwon Kim
Rok vydání:	2016
Předmět:	010302 applied physics Trap (computing) Materials science business.industry 0103 physical sciences Electrical engineering Current (fluid) business 01 natural sciences Engineering physics
Zdroj:	KEPCO Journal on Electric Power and Energy. 2:223-225
ISSN:	2465-8111
DOI:	10.18770/kepco.2016.02.02.223
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::145c6c21db84accff6d18e223051bddf https://doi.org/10.18770/kepco.2016.02.02.223 Zobrazit plný text záznamu