Autor:	St. B. Peshkalova, D. B. Kushev, N. N. Zheleva, T. N. Nevzat
Rok vydání:	2007
Předmět:	Semiconductor thin films Materials science Absorption edge business.industry Band gap Optoelectronics Thin film business Reflectivity
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
DOI:	10.1063/1.2733431
Popis:	Transmissivity and refelectivities of SnTe thin films are measured for determination of the optical band gap. Step like form of the absorption edge spectral dependence appear for sample thicknesses less than 0.3 μm. There is also shifting of the absorption edge to higher energy.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::14291d53782bff7f81f8ca2dea5641d8 https://doi.org/10.1063/1.2733431 Zobrazit plný text záznamu