An investigation of a metastable form of GaS by convergent-beam electron diffraction and high-resolution electron microscopy
Autor: | P. Goodman, H.J. Whitfield, A. Olsen |
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Rok vydání: | 1985 |
Předmět: |
Reflection high-energy electron diffraction
Low-energy electron diffraction Electron diffraction Chemistry Gas electron diffraction Analytical chemistry Energy filtered transmission electron microscopy General Medicine Selected area diffraction High-resolution transmission electron microscopy General Biochemistry Genetics and Molecular Biology Electron backscatter diffraction |
Zdroj: | Acta Crystallographica Section B Structural Science. 41:292-298 |
ISSN: | 0108-7681 |
Popis: | GaS prepared at temperatures below that required for adequate annealing is found to yield microcrystals with a much higher stacking-fault density and correspondingly lower overall crystal symmetry than that found for hexagonal /3-GAS. The results of a highresolution electron-microscopy analysis suggest that this character is associated with the predominance in the material of a high-pressure modification of GaS, present metastably in the partially annealed sample. It is concluded that details of preparation, including final annealing, are important in determining the microscopic crystal structure, and that discrepancies which have been highlighted recently between singlecrystal diffraction measurements and those carried out on bulk microcrystalline samples may largely be explained by differences in preparative technique. |
Databáze: | OpenAIRE |
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