| Autor: |
Aparnikov, A.N., Orlov, N.E., Yakimov, A.V. |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| DOI: |
10.34660/inf.2020.49.26.001 |
| Popis: |
By means of developed simplified thermal model of semiconductor laser diode bar relations between active region defect acceleration factor and injection current, duty cycle, temperature of heatsink were obtained. The major effect on active region defect acceleration has duty cycle and heatsink temperature parameters. Mean time to failure value can be evaluated with accelerated aging tests with setting operating parameter value over nominal. Obtained acceleration factor values can be used for short time evaluation of laser diode bar mean time to failure. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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