The Investigation of Under-twist Defect Near the Threshold in STN-LCD

Autor:	Philip J. Bos, James Roman, Jon Judson, Shuxin Li
Rok vydání:	1999
Předmět:	Engineering Liquid-crystal display Key factors business.industry law Optoelectronics Structural engineering Twist business law.invention
Zdroj:	SID Symposium Digest of Technical Papers. 30:640
ISSN:	0097-966X
DOI:	10.1889/1.1834105
Popis:	We have investigated the under-twist defect which occurs near the Vth of a STN cell and analyzed key factors for the formation of this defect: surface alignment, d/p ratio, LC material parameters. Based on the investigation, we suggested approaches to avoid this defect.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::13b9aa20c2854a5a63a3e5af5434ccf2 https://doi.org/10.1889/1.1834105 Zobrazit plný text záznamu Plný text