Electron Energy Loss Spectroscopy of Surfaces and Interfaces
| Autor: | O. L. Krivanek |
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| Rok vydání: | 1981 |
| Předmět: | |
| Zdroj: | Proceedings, annual meeting, Electron Microscopy Society of America. 39:216-217 |
| ISSN: | 2690-1315 0424-8201 |
| Popis: | The structure of bulk surfaces can be studied by reflection electron microscopy and the structure of interfaces in thin foils by TEM. Both methods are capable of nearly atomic-level resolution. This paper explores whether the structural information can be supplemented with chemical and electronic information by the use of electron energy loss spectroscopy.Energy loss spectra from the surface of bulk Be have been obtained at 35kV primary energy by Klein, and spectra of the Si surface at 14.2kV have been obtained by Schilling, who also demonstrated that the relative strength of the volume and the surface plasmon can be altered by changing the reflection geometry.Fig. 1 contains two energy loss spectra obtained in surface reflection from (100) Si at 100kV in a standard TEM (Philips 400) with a magnetic sector energy analyzer (Gatan 607), and a diagram showing the geometry of the incident beam and the beam admitted into the spectrometer relative to the surface. |
| Databáze: | OpenAIRE |
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