Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM)
| Autor: | Yoo-Chang Sung, Seong-Jin Jang, Jung-Hwan Choi, Gyo-Young Jin, Sang-hoon Shin, Yong-Hwan Kim, Beomyong Kil, Kim Wang-Soo, Hye-Seung Yu, Yong-Cheol Bae, S.J. Ahn, Won-Joo Yun, Jae-Hun Jung, Kang Sukyong, Kyung-woo Nam, Hyunui Lee, Kyomin Sohn, In-Dal Song, Park Yong-Sik |
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| Rok vydání: | 2016 |
| Předmět: |
Engineering
business.industry 020208 electrical & electronic engineering Bandwidth (signal processing) 02 engineering and technology High Bandwidth Memory law.invention Phase-locked loop Automatic test equipment law 0202 electrical engineering electronic engineering information engineering Electronic engineering Resistor business Electrical impedance Electronic circuit |
| Zdroj: | A-SSCC |
| DOI: | 10.1109/asscc.2016.7844162 |
| Popis: | This paper presents a HBM device which verifies DC and AC characteristics of I/O circuits without direct contact on the u-bump. To verify DC and AC characteristics internally, design for excellence (DFx) circuits are implemented. Also, to perform accurate impedance calibration without ZQ pin, reference resistor calibration logic is embedded. In comparison of DFx AC result and automatic test equipment measurement result, it is confirmed that the DFx AC operation is well correlated with normal operation up to 2Gb/s. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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