Position-Sensitive Silicon Detector for X-Ray Difractometry of Rapid Processes

Autor:	V.M. Pugatch
Rok vydání:	2014
Předmět:	Information Systems and Management Materials science Optics Position (vector) business.industry Management of Technology and Innovation X-ray Silicon detector business Law Engineering (miscellaneous) Computer Science Applications
Zdroj:	Science and innovation. 10:25-30
ISSN:	2409-9066
DOI:	10.15407/scine10.02.025
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::132058f777d0b0d3cef31c47cabf5ae4 https://doi.org/10.15407/scine10.02.025 Zobrazit plný text záznamu