| Autor: |
Ming-Wei Lin, M. Hossain, Sumio Ikegawa, Yew Tuck Chow, J. H. Lee, H.-J. Chia, M. DeHerrera, J. Janesky, Renu Whig, C. C. Wang, Kerry Joseph Nagel, Jon M. Slaughter, Francis Poh, Sarin A. Deshpande, Frederick B. Mancoff, Syed M. Alam, Hong-xi Liu, Seung-Mo Noh, Sanjeev Aggarwal, Yi Jiang, S. K. Ye, J. J. Sun, Taiebeh Tahmasebi, Danny Pak-Chum Shum, Thomas Andre, G. Shimon, Michael Tran |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
2016 IEEE International Electron Devices Meeting (IEDM). |
| Popis: |
In this paper we present an overview of important features for reliable and manufacturable ST-MRAM as well as new results in two areas: pMTJ arrays with data retention sufficient for programming before 260°C wave solder, and performance of a 256Mb, DDR3 ST-MRAM product chip. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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