Characterization of interfacial growth between Bi(2212) and Ag coating
| Autor: | Dimitris Kouzoudis, Douglas K. Finnemore, U. Balachandran, M. Breitwisch, J. E. Ostenson |
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| Rok vydání: | 1997 |
| Předmět: |
Surface diffusion
Materials science Scanning electron microscope Analytical chemistry Partial pressure engineering.material Condensed Matter Physics Microstructure Electronic Optical and Magnetic Materials Coating Secondary emission engineering Electrical and Electronic Engineering Environmental scanning electron microscope Hillock |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 7:1691-1694 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.620904 |
| Popis: | The growth of hillocks at the interface between Bi(2212) and Ag has been found to occur over a wide range of oxygen partial pressure and in the vicinity of 700/spl deg/C, a temperature far below the Bi(2212)-Bi(2223) conversion temperature. These hillocks have been examined by environmental scanning microscope (ESEM) and regular SEM in secondary and backscattering modes. Definitive chemical analysis is still an open question. The Ag is highly mobile at these temperatures. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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