Laser ablation of CsI analyzed by delayed extraction
| Autor: | E. F. da Silveira, C.R. Ponciano, L. S. Farenzena, E. Pedrero, Francisco Fernandez-Lima, V.M. Collado |
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| Rok vydání: | 2003 |
| Předmět: |
Delayed extraction
Laser ablation Chemistry Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Plasma Condensed Matter Physics Laser Surfaces Coatings and Films law.invention Plume law Radiative transfer Plasma diagnostics Atomic physics Diffusion (business) |
| Zdroj: | Applied Surface Science. 217:202-209 |
| ISSN: | 0169-4332 |
| Popis: | Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337 nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200 ns). The TOF peak shape is characterized by a Gaussian-like structure (fast component), followed by a tail (slow component) that is more pronounced when the extraction field is delayed. A thermal-sputtering uni-dimensional model is employed to describe the solid surface and plasma temperatures as a function of time. Heat diffusion, vapor photo-ionization, radiative emission and plume expansion are considered. Within the approximations used, the model predicts reasonable drift velocities of the plume (≈1.4 km s−1) but very high plasma temperatures (≈105 K). The width of the TOF peak fast component allows determination of the plume temperature during its expansion. |
| Databáze: | OpenAIRE |
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