Phase-Measuring Interferometry: Applications And Techniques

Autor:	H.Philip Stahl, Jay A. Tome
Rok vydání:	1989
Předmět:	Contouring Engineering business.industry Emphasis (telecommunications) Holography Topology (electrical circuits) Holographic interferometry law.invention Interferometry Optics law Nondestructive testing Astronomical interferometer business
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.947575
Popis:	A review of the current state of phase-measuring interferometry is presented. Emphasis is placed on the broadening field of applications for the technique including; micro-surface topology, non-destructive testing, and surface contouring. Advance techniques of extending the range of phase-measuring interferometry and high speed data sampling are presented, along with two other techniques of interest.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::12696843d220928c28daeecde86dbc2b https://doi.org/10.1117/12.947575 Zobrazit plný text záznamu