CeB6 thin films produced on different substrates by electron-beam deposition
| Autor: | V. Vardanyan, V. N. Gurin, G. R. Badalyan, S. I. Petrosyan, A. A. Kuzanyan, Mikhail P. Volkov, S Kh Pilosyan, Armen S. Kuzanyan |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science business.industry Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Microstructure 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials chemistry.chemical_compound Semiconductor chemistry Electrical resistivity and conductivity visual_art Seebeck coefficient 0103 physical sciences Thermoelectric effect visual_art.visual_art_medium Ceramic Thin film Cerium hexaboride 0210 nano-technology business |
| Zdroj: | Semiconductors. 51:999-1001 |
| ISSN: | 1090-6479 1063-7826 |
| DOI: | 10.1134/s1063782617080176 |
| Popis: | Films of cerium hexaboride, a material promising for use in thermoelectric devices at liquidhelium temperatures, are produced by electron-beam deposition. Deposition is carried out from ceramic targets onto insulator, semiconductor, and metal substrates at different temperatures. The microstructure, the elemental and phase compositions, the temperature dependences of the resistivity and the Seebeck coefficient are thoroughly studied. CaB6-structured films, for which the structure is characteristic of cerium hexaboride and the elemental composition is close to the stoichiometric composition, are obtained. At low temperatures, the resistivity of the films is somewhat higher than that of single-crystal samples, and the Seebeck coefficient is close to the corresponding coefficient for single-crystal samples. The main cause of the difference between the resistance values is a high concentration of oxygen impurity detected in the films. |
| Databáze: | OpenAIRE |
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