| Autor: |
C. Chauvin, T. Ellis, S. Poulin-Dandurand, Arthur Yelon, S. Gujrathi, A. Domingue, Edward Sacher, L. Lemay, L. Dignard-Bailey |
| Rok vydání: |
2002 |
| Předmět: |
|
| Zdroj: |
Annual Conference on Electrical Insulation and Dielectric Phenomena. |
| DOI: |
10.1109/ceidp.1990.201369 |
| Popis: |
Surface and near-surface analyses were used to follow the deposition of copper and gold on polyimide. Metals react on deposition onto polyimide, with some continuing to react on thermal aging. A long use life for such an electrode/insulator system depends on the choice of a metal which is minimally reactive on deposition and not reactive on thermal aging. Nuclear scattering (both elastic recoil detection and Rutherford backscattering) was used to obtain elemental concentrations as a function of depth. X-ray photoelectron spectroscopy was used to study the chemical reactions at the interface through the measurement and interpretation of chemical shifts. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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