Sensitivities in High-Bandwidth, High-Current Shunt Measurements for Silicon-Carbide Multi-Chip Power Modules

Autor:	Christopher D. New, Andrew N. Lemmon, Brian T. DeBoi
Rok vydání:	2022
Zdroj:	2022 IEEE Applied Power Electronics Conference and Exposition (APEC).
DOI:	10.1109/apec43599.2022.9773588
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::11d395f24f545e6f227cc4429bb86a3c https://doi.org/10.1109/apec43599.2022.9773588 Zobrazit plný text záznamu